RFQ – Metrology Please help fill in the following Customer Survey Form for suitable Metal Film Metrology model and configuration for your applications. Appreciate your time. Thank you very much. 1. Your Name(Required): 2. Your Email(Required): 3. Your Company Name(Required): 4. Company Address: 5. Substrate Maximum Size(Required): Small Sample1 inch2 inch3 inch4 inch5 inch6 inch8 inchOthersNot sure 6. Substrate Material(Required): SiSiCGaAsGaNGaInPInPOthersNot sure 7. Measurement Parameters(Required): Sheet ResistanceFilm ThicknessOthersNot sure 8. Thin Film Materials(Required): Epi-SemiconductorAlAuWTaNxCuOthersNot sure 9. Substrate Resistivity(Ω.cm,Required): <0.050.05-11-100100-100K>100kOthersNot sure 10. Thin Film resistivity(mΩ.cm,Required): <0.0010.001-11-100100-100K>100kOthersNot sure 11. Multi-Layer Substrate? Specify if Yes(Required) : 12. Data Output(Required): File of ComputerPrinterOthersNot sure 13. Environment Temperature (Required) : Under ControlledRoom Temperature (No Control)OthersNot sure 14. Parameter Range: Film Sheet resistance(Ω/□ , Required): 0.001-11-2000OthersNot sure 15. Parameter Range: Film thickness (Angstroms, Required): <100100- 200k>200kOthersNot sure 16. Did you use any Thin Film Sheet Resistance Measurement Instrument which met your requirements? If yes, pls specify brand and model. 17. Approximate budget(Required): < USD$ 5K< USD$ 10K< USD$ 15K< USD$ 20K< USD$ 25K< USD$ 30K< USD$ 50K< USD$ 60K< USD$ 70K< USD$ 80K> USD$ 80KNot sureOthers 18. Approximate purchasing time (Required): <In 1 monthIn 2 monthsIn 3 monthsIn 6 monthsIn 9 monthsIn 12 monthsIn 24 monthsNot sureOthers 19. Throughput Requirement : <R&D only<10 wafers per day<20 wafers per day<30 wafers per day<40 wafers per day<50 wafers per day<100 wafers per day<200 wafers per day<500 wafers per day>500 wafers per dayNot sureOthers 20. Special Requirements: Include Files(Limit:3M File types:PDF|JPG|JEPG): Files1 : Files2 : Files3 : Files4 : Enter the characters shown in the image.